Residual Stress Evaluation at Bone Implant Interfaces Using High Energy X-Ray Diffraction-Reference-Cited by-同舟云学术

Residual Stress Evaluation at Bone Implant Interfaces Using High Energy X-Ray Diffraction

Published:2010-05 Issue: Volume:652 Page:180-184
ISSN:1662-9752
Container-title:Materials Science Forum
language:
Short-container-title:MSF

Author:

Mireux Bastien¹,Buslaps Thomas²,Honkimäki Veijo²,Lodini Alain³,Sprauel Jean Michel⁴

Affiliation:

1. European Synchrotron Radiation Facility

2. ESRF European Synchrotron Radiation Facility

3. LISM

4. Aix Marseille Universités

Abstract

The present study is dedicated to high energy x-ray diffraction measurements of residual stress at bone-implant interfaces. Bone regeneration is different from soft tissue repair as scar formation never occurs and as de novo bone tissue is produced with proliferation and differentiation of mesenchymal cells. To start the bone remodelling, the stress – the most important mechanical factor – should stimulate the osteocytes. Osseointegration is also observed with non-functional implants, in particular with dental implants. This means that a stress similar to a residual stress must exist.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Link

https://www.scientific.net/MSF.652.180.pdf

Reference8 articles.

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