Optical and Electrical Simulation of 4H-SiC UV Photodetector by Finite Element Method

Author:

Biondo Stéphane1,Vervisch Wilfried2,Ottaviani Laurent2,Palais Olivier3

Affiliation:

1. Université Paul Cézanne

2. Aix-Marseille University

3. Aix-Marseille Université

Abstract

This paper focuses on UV-photodetector simulation. The calculus method description and the physical equations which occur in this model are presented as well as the UV-photodetector structure (p+n--n+ diode). Based on the Finite Element Method the electrical part solves the continuity and Poisson equation, and the optical part solves by Maxwell’s equation, FDTD [1]. Simulation works point out the influence of the p+-type layer on the electrical characteristics such as the current densities versus reverse bias. Indeed, simulation results show the current density increase with the decrease doping concentration or the p+-type layer thickness.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference10 articles.

1. A. Tavlove, Computational Electrodynamics: The Finite-Difference Time-Domain Method, (Artech House, Norwood, MA, 1995).

2. H. Matsuura, S. Kagamihara, Y. Itoha, T. Ohshima and H. Itoh, Sci. Dir. Vol 376 (2006) p.342.

3. J. Nord, K. Nordlund, J. Keinonen and K. Albe, Sci. Dir. Vol. 202 (2003), p.93.

4. W. Shockley and W.T. Read, Jr, Phys. Rev. Vol. 87 (1952) p.835.

5. Y. Okuto and C.R. Crowell, Phys. Rev. Vol. 10 (1974) p.4284.

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