Silicon Carbide Growth:C/Si Ratio Evaluation and Modeling
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Published:2008-09
Issue:
Volume:600-603
Page:83-88
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ISSN:1662-9752
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Container-title:Materials Science Forum
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language:
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Short-container-title:MSF
Author:
Pons Michel1,
Nishizawa Shin Ichi2,
Wellmann Peter J.3,
Blanquet Elisabeth4,
Chaussende Didier5ORCID,
Dedulle Jean Marc1,
Madar Roland5
Affiliation:
1. Grenoble INP–CNRS-UJF
2. National Institute of Advanced Industrial Science and Technology (AIST)
3. University of Erlangen-Nuremberg
4. Domaine Universitaire
5. UMR CNRS 5628, INP Grenoble-MINATEC
Abstract
Modeling and simulation of the SiC growth processes, Physical Vapor Transport (PVT), Chemical Vapor Deposition (CVD), are sufficiently mature to help building new process equipment or up-scaling old ones. It is possible (i) to simulate accurately temperature and deposition distributions, as well as doping (ii) to quantify the limiting phenomena, (iii) to understand the important role of different precursors in CVD and hydrogen additions in PVT. The first conclusion of this paper is the importance of the "effective" C/Si ratio during CVD epitaxy in hot-wall reactors and its capability to explain the doping concentrations. The second conclusion is the influence of the C/Si ratio in alternative bulk growth technique involving gas additions.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science