Thin Layered Structures Analysis Using NUR Reflectometer
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Published:2009-01
Issue:
Volume:609
Page:53-58
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ISSN:1662-9752
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Container-title:Materials Science Forum
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language:
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Short-container-title:MSF
Affiliation:
1. Centre de Recherche Nucléaire de Draria (CRND)
Abstract
Reflectometry technique in Centre de Recherché Nucléaire de Draria (CRND) is operational since 2002. The instrument is used for investigation of monochromators and supermirrors. In this communication, several monochromators: 10 and 40 nickel-titanium bilayers deposited on a float-glass substrate with different period are analysed. The investigation of magnetic multilayers (25 silicon-iron bilayers monochromator) is also performed. From the results, Bragg peaks were identified indicating the periodicity of the multilayers.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science