Affiliation:
1. Nanjing University of Science and Technology
Abstract
Fatigue crack growth resistance of ultrafine grained Cu processed by equal channel angular pressing (ECAP) was investigated. Particular emphasis was devoted to the effects of microstructure evolution on fatigue crack growth in the near-threshold regime. The ultrafine grained Cu exhibits a lower fatigue threshold than coarse-grained Cu at stress ratios of 0.1 and 0.7. Fatigue induced coarsening of the UFG structure near the fatigue crack and intergranular fatigue crack growth are observed.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science