X-Ray Diffraction Studies of Nanostructured Metallic Alloys

Abstract

X-ray tools are being powerful methods for qualitative and quantitative analyses of nanocrystalline materials This work is an overview of detailed X-ray investigations relative to microstructural studies applied for a refined binary Al-based alloys thin films system as samples deposited on glass substrates. Energy dispersive analysis of X-ray (EDAX), X-ray diffraction (XRD) and transmission electron microscopy (TEM) methods were used to determine the chemical composition, the microstructure parameters and the solubility of copper in aluminum.