Characterisation of YSZ Layers Deposited on Y2O3 Buffered Textured Tapes for Coated Conductors

Abstract

Yttria-stabilized zirconia (YSZ) films were deposited on Y2O3/Ni-5at.%W substrates serving as the barrier layers for coated conductors by reel-to-reel direct-current (D.C.) magnetron reactive sputtering. The deposition parameters, such as the substrate temperature and tape moving speed, were systematically investigated. X-ray diffraction analysis confirmed that optimized YSZ/Y2O3buffer layers showed excellent in-plane and out-of-plane textures. Atomic force microscope revealed a smooth, dense and crack-free surface. The subsequent CeO2cap layer and 1μm-thick YBa2Cu3O7-δfilm sequentially prepared, showing the critical current densityJcunder 77K, self-field of 1.4MA/cm2.