Structural, Optical and Electrical Properties of ZnxSn1-xS Thin Films Deposited by Chemical Spray Pyrolysis

Author:

Zaidi Beddiaf1,Houaidji Naoual2,Khadraoui Asma2,Gagui Souheyla2,Shekhar Chander3,Ozen Yunus4,Kamli Kenza5,Hadef Zakaria5,Donmez Meltem4,Comert Buse4,Ozcelik Suleyman4,Chouial Baghdadi2,Hadjoudja Bouzid2

Affiliation:

1. University of Batna 1

2. University Badji Mokhtar

3. Amity University Gurgaon

4. Gazi University

5. Université 20 août 1955

Abstract

In the present study, ZnxSn1-xS (x = 0, 0.25, 0.5, 0.75 and 1) thin film samples were deposited by ultrasonic spray pyrolysis technique on glass substrates at 350°C to investigate the effect of variation of Zn concentration (x) on the structural, morphological, optical and electrical properties of ZnxSn1-xS thin films. The films were deposited by varying Zn content in the starting solution. The films deposited were found to be amorphous having root mean square (RMS) roughness ranged from 18.2 to 93.5 nm. The optical characterization by UV-Vis spectroscopy showed that the transmittance and reflectance of all samples are lower than 12.2 % and 10 % respectively. The optical band gap was estimated from the reflectance and transmittance spectra are about 3.86 eV. The carrier mobility is ranged from 113 to 2600 cm2/v.s.

Publisher

Trans Tech Publications, Ltd.

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