Photoelectric Phenomena and Photoelectric Characterization Methods of the MOS System - Basics and New Developments
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Published:2016-02
Issue:
Volume:39
Page:69-79
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ISSN:1661-9897
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Container-title:Journal of Nano Research
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language:
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Short-container-title:JNanoR
Affiliation:
1. Institute of Electron Technology
Abstract
In this article photoelectric phenomena taking place in the MOS system will be discussed and the classical theory of these phenomena will be presented. This will be followed by pointing out some shortcomings of this theory and presentation of our contributions which eliminate these shortcomings and allow development of new MOS system characterization methods.
Publisher
Trans Tech Publications, Ltd.