Achieving Traceability of Industrial Computed Tomography

Author:

Bartscher Markus1,Neukamm Marko1,Hilpert Uwe1,Neuschaefer-Rube Ulrich1,Härtig Frank2,Kniel Karin2,Ehrig Karsten3,Staude Andreas3,Goebbels Jürgen3

Affiliation:

1. Physikalisch-Technische Bundesanstalt (PTB)

2. Physikalisch-Technische Bundesanstalt

3. BAM Bundesanstalt für Materialforschung und Prüfung

Abstract

Achieving traceability is crucial for complex measurement techniques, especially for coordinate measuring machines (CMMs). For CMMs using tactile probes, traceability can for certain measurements be achieved using model-based uncertainty budgets. Up to now, uncertainty simula-tions could be used applicable only for tactile CMM measurements of regular geometries, but are available as an add-on for different CMMs. This procedure is accepted by guidelines and inter-national standards (VDI/VDE 2617-7, supplement 1 [1] to GUM). Furthermore, empirical ap-proaches to assess the measurement uncertainty by means of calibrated workpieces or prior know-ledge exist or are under development. These approaches can as a matter of principle also be used for CMMs featuring computed tomography (CT). In this paper, the empirical assessment of the mea-surement uncertainty of the upcoming measurement technology CT [2, 3] will be discussed uniting the present approaches and the current knowledge, with the focus being on the applicability of con-cepts for users in industry. For this purpose, the influences on dimensional CT measurements are analyzed and evaluated, taking the measurement data of a current industrial micro CT system as a basis.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Reference8 articles.

1. BIPM, IEC, IFCC, ILAC, ISO, IUPAC, IUPAP, and OIML: Evaluation of measurement data - Supplement 1 to the Guide to the expression of uncertainty in measurement, - Propagation of distributions using a Monte Carlo method, JCGM 101 (2008).

2. M. Bartscher, U. Hilpert, J. Goebbels, G. Weidemann: Enhancement and Proof of Accuracy of Industrial Computed Tomography (CT) Measurements, CIRP Annals - Manufacturing Technology, Vol. 56, Issue 1 (2007), pp.495-498.

3. M. Bartscher, U. Hilpert, F. Härtig, U. Neuschaefer-Rube, J. Goebbels, A. Staude: Industrial Computed Tomography, an Emerging Coordinate Measurement Technology with High Potentials, Proc. of NCSL International, Aug. 3-7 2008, Orlando FL, USA (2008).

4. BIPM/IEC/IFCC/ISO/IUPAC/IUPAP/OIML: Guide to the expression of uncertainty in measurement (GUM), (1995).

5. F. Härtig, M. Krystek: Correct treatment of systematic errors for the evaluation of measurement uncertainty. Proc. The 9th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2009), Vol. 1 (2009), pp.1-019.

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3