Examination of Si<sub>1-x</sub>Ge<sub>x</sub> Laterally Graded Crystals for Use in High Brilliance Synchrotron Beams-Reference-Cited by-同舟云学术

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Examination of Si_1-xGe_x Laterally Graded Crystals for Use in High Brilliance Synchrotron Beams

Published:1999-05 Issue: Volume:308-311 Page:597-602
ISSN:1662-9752
Container-title:Materials Science Forum
language:
Short-container-title:MSF

Author:

Veldkamp M.,Erko A.¹,Schäfers F.,Gudat W.²,Abrosimov N.V.,Alex Volker,Rossolenko S.,Shekhtman V.,Shulakov E.,Khasanov S.,Smirnova I.³

Affiliation:

1. Hahn-Meitner-Institut Berlin GmbH

2. BESSY

3. Russian Academy of Medical Sciences

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Link

https://www.scientific.net/MSF.308-311.597.pdf

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Diffraction efficiency and diffraction bandwidth of thermal-gradient and composition-gradient crystals;Review of Scientific Instruments;2005-12

2. Crystalline microundulator;Technical Physics;2004-04

3. Laterally-Graded SiGe Crystals for High Resolution Synchrotron Optics;Crystal Research and Technology;2002-07

4. A crystal monochromator based on graded SiGe crystals;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2001-07

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