Using Ag95Al-Ti to Braze Si/SiC and Invar Alloy

Author:

Zhang Hua1,Huang Ji Hua1,Zhao Hua Tao1,Zhao Xin Ke1

Affiliation:

1. University of Science and Technology Beijing

Abstract

In this paper, the effect of different Ti content on the brazed joint microstructures was studied, including the reaction zone states, microstructures of the reaction interface on both ceramic and Invar alloy side. The added Ti content was 2%, 3%, 5%, 6% and 10%. The results showed that Ti had great effect on the thickness of reaction layer on the invar alloy side. Ti can inhibit the growth of the diffusion layer.

Publisher

Trans Tech Publications, Ltd.

Subject

General Engineering

Reference10 articles.

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3. M. Claus, P. Ulrich. C/SiC high precision light-weighty components for optical applications. Bellingham: The International Society for Optical Engineering (2001).

4. F. Tamai, M. Naka. Microstructure of interface of SiC/Cu-Ag-Ti/Cu,Ni.Proceeding of Designing of Interfacial Structures in Advanced Materials and Their Joints,Japan,2002:p.634.

5. F. Ono, S. Komatsu, Y. Chimi, N. Ishikawa. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 230(2005), p.279.

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