METROLOGICAL RISKS AND STATE OF THE MONITORED OBJECTS-Reference-Cited by-同舟云学术

METROLOGICAL RISKS AND STATE OF THE MONITORED OBJECTS

Published:2022 Issue:1 Volume:83 Page:17-23
ISSN:0368-6418
Container-title:Measuring Equipment and Metrology
language:
Short-container-title:MEM

Author:

Yatsyshyn Svyatoslav^ORCID, ,Baitsar Roman^ORCID,Lazarenko Sergii^ORCID,Lazarenko Nadiya^ORCID,Mastylo Rostyslav, , , ,

Abstract

The metrological risks of goods production are studied in the work. They are estimated conjugating with the existing technology as well as its metrological support. It is confirmed that in addition to the factors due to the processing of measurement results, the peculiarities of metrological support should be taken into account. One of the characteristic parameters of the metrological instruments is the variance of the measured value. Multiple measurements of the electrical resistance of the mentioned instruments - high-precision resistors designed for indirect measurement of current by measuring the voltage on them, using a DC bridge, were performed. The variance of obtained results is estimated, depending on the number of repeated measurements, the time interval between them, etc.

Publisher

Lviv Polytechnic National University

Subject

Automotive Engineering

Reference12 articles.

1. [1] ISO/IEC Guide 98-4:2012. Uncertainty of measurement - Part 4: Role of measurement uncertainty in conformity assessment. [Online]. Available: https://www.iso. org/ru/standard/50465.html

2. [2] IATF 16949 : 2016. [Online]. Available: https://www.en-standard.eu/iatf-16949-2016-qualitymanagement-system-for-organizations-in-the-automotiveindustry/?gclid= Cj0KCQiAw9qOBhC

3. [3] D. Montgomery, G. Runger, Applied Statistics and Probability for Engineers, 6th Ed. [Online]. Available: https://www.amazon.com/Applied-Statistics-ProbabilityEngineers-Montgomery/dp/1118539710.

4. [4] J.M. Pou, L. Leblond, Smart Metrology: From the metrology of instrumentation to the metrology of decisions, Art. 01007, Jan. 2017, Conf.18th Int. Congress of Metrology, [Online]. Available: https://doi.org/10.1051/metrology /201701007

5. [5] G. Luz, R. Verjan, Smart Sampling for Risk Reduction in Semiconductor Manufacturing. Ecole Nat. Supérieure des Mines de Saint-Etienne, 2014. English. ffNNT : 2014EMSE0747ff. fftel-01126975.