SH-Wave Scattering From the Interface Defect-Reference-Cited by-同舟云学术

SH-Wave Scattering From the Interface Defect

Published:2017-11-28 Issue:1 Volume:5 Page:45-50
ISSN:2524-0382
Container-title:Advances in Cyber-Physical Systems
language:
Short-container-title:ACPS

Author:

Voytko Myron, ,Kulynych Yaroslav,Kuryliak Dozyslav

Abstract

The problem of the elastic SH-wave diffraction from the semi-infinite interface defect in the rigid junction of the elastic layer and the half-space is solved. The defect is modeled by the impedance surface. The solution is obtained by the Wiener- Hopf method. The dependences of the scattered field on the structure parameters are presented in analytical form. Verifica¬tion of the obtained solution is presented.

Publisher

Lviv Polytechnic National University

Reference29 articles.

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