The Effect of Series and Shunt Redundancy on Power Semiconductor Reliability-Reference-Cited by-同舟云学术

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The Effect of Series and Shunt Redundancy on Power Semiconductor Reliability

Published:2016-07-20 Issue:4 Volume:16 Page:1426-1437
ISSN:1598-2092
Container-title:Journal of Power Electronics
language:en
Short-container-title:Journal of Power Electronics

Author:

Nozadian Mohsen Hasan Babayi,Zarbil Mohammad Shadnam,Abapour Mehdi

Publisher

The Korean Institute of Power Electronics

Subject

Electrical and Electronic Engineering,Control and Systems Engineering

Link

http://ocean.kisti.re.kr/downfile/crosscheck/kipe/JAKO201623661379746.pdf

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Reliability forecasting and Accelerated Lifetime Testing in advanced CMOS technologies;Microelectronics Reliability;2023-12

2. Power equipment fault information acquisition system based on Internet of things;EURASIP Journal on Wireless Communications and Networking;2021-03-24

3. Class of high step‐up switched Z‐source inverters: steady state analysis and objective function;IET Power Electronics;2019-03-07

4. A Developed Structure for DC–DC Quasi-Z-Source Converter with High Voltage Gain and High Reliability;Journal of Circuits, Systems and Computers;2018-10-15

5. Reconfigurable Multilevel Inverter With Fault-Tolerant Ability;IEEE Transactions on Power Electronics;2018-09

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