Time multiplexed LBIST for in-field testing of automotive AI accelerators-Reference-Cited by-同舟云学术

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Time multiplexed LBIST for in-field testing of automotive AI accelerators

Published:2021-12-25 Issue:24 Volume:18 Page:20210451-20210451
ISSN:1349-2543
Container-title:IEICE Electronics Express
language:en
Short-container-title:IEICE Electron. Express

Author:

Solangi Umair Saeed¹,Ibtesam Muhammad¹,Park Sungju¹

Affiliation:

1. Dept. of Computer Science & Engineering, Hanyang University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://www.jstage.jst.go.jp/article/elex/18/24/18_18.20210451/_pdf

Reference32 articles.

1. [1] P.J. Bannon: U.S. Patent 0 026 078 A1 (2017).

2. [2] N.P. Jouppi, et al.: “In-datacenter performance analysis of a tensor processing unit,” 2017 ACM/IEEE 44th Annual International Symposium on Computer Architecture (ISCA), (2017) 1 (DOI: 10.1145/3079856.3080246).

3. [3] J. Ross, et al.: U.S. Patent 9747546 B2 (2015).

4. [4] J. Ross and A. Phelps: U.S. Patent 9697463 B2 (2015).

5. [5] J. Ross: U.S. Patent 9805304 B2 (2015).

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