Optoelectronic frequency response measurement of photodiodes by using high-extinction ratio optical modulator

Author:

Inagaki Keizo1,Kawanishi Tetsuya1,Izutsu Masayuki2

Affiliation:

1. Photonic Network Research Institute, National Institute of Information and Communications Technology

2. Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. [1] T. Kawanishi, T. Sakamoto, and M. Izutsu, “High-speed control of lightwave amplitude, phase, and frequency by use of electrooptic effect,” IEEE J. Sel. Topics Quantum Electron., vol. 13, no. 1, pp. 79-91, Jan. 2007.

2. [2] P. D. Hale, C. M. Wang, R. Park, and W. Y. Lau, “A transfer standard for measuring photoreceiver frequency response,” J. Lightw. Technol., vol. 14, no. 11, pp. 2457-2466, Nov. 1996.

3. [3] P. D. Hale and C. M. Wang, “Calibration service of optoelectronic frequency response at 1319nm for combined photodiode/RF power sensor transfer standards,” NIST Special Publication 250-51, Dec. 1999.

4. [4] “Specifications for optical to electrical measurement at 1550nm,” Agilent N4373C 40/50/67GHz single-mode lightwave component analyzer for 40/100G electro-optical test data sheet, Agilent, p. 11, Oct. 2010 [Online] http://www.home.agilent.com/

5. [5] T. Kawanishi, T. Sakamoto, A. Chiba, M. Tsuchiya, and H. Toda, “Ultra high extinction-ratio and ultra low chirp optical intensity modulation for pure two-tone lightwave signal generation,” Proc. CLEO 2008, San Jose, U.S.A., CFA1, May 2008.

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