Influence of trapped flux on critical currents of Josephson junctions-Reference-Cited by-同舟云学术

Influence of trapped flux on critical currents of Josephson junctions

Published:2008 Issue:11 Volume:5 Page:431-436
ISSN:1349-2543
Container-title:IEICE Electronics Express
language:en
Short-container-title:IEICE Electron. Express

Author:

Ebert Bjoern¹,Reich Torsten²,Ortlepp Thomas¹,Febvre Pascal²,Uhlmann F. Hermann¹

Affiliation:

1. Institute of Information Technology, Ilmenau University of Technology, RSFQ Design Group

2. Microwave and Characterization Laboratory, IMEP-LAHC, UMR CNRS 5130, University of Savoie

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://www.jstage.jst.go.jp/article/elex/5/11/5_11_431/_pdf

Reference10 articles.

1. [1] P. Bunyk, K. Likharev, and D. Zinoviev, “RSFQ Technology: Physics and Devices, ”International Journal on High Speed Electronics and Systems, vol. 11, no. 1, pp. 257-306, 2001.

2. [2] A. Barone and G. Paterno, Physics and Applications of the Josephson Effect, John Wiley & Sons Inc, 1982.

3. [3] V. V. Schmidt, The Physics of Superconductors, P. Mueller and A. V. Ustinov (eds.), Berlin Heidelberg: Springer-Verlag, 1997.

4. [4] S. Bermon and T. Gheewala, “Moat-guarded Josephsons SQUIDs, ” Transactions on Magnetics, vol. 19, no. 3, pp. 1160-1164, May 1983.

5. [5] R. P. Robertazzi, I. Siddiqi, and O. Mukhanov, “Flux trapping experiments in single flux quantum shift registers, ”IEEE Trans. Appl. Supercond., vol. 7, no. 2, pp. 3164-3167, June 1997.

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