Adversarial Metric Learning with Naive Similarity Discriminator-Reference-Cited by-同舟云学术

Adversarial Metric Learning with Naive Similarity Discriminator

Published:2020-06-01 Issue:6 Volume:E103.D Page:1406-1413
ISSN:0916-8532
Container-title:IEICE Transactions on Information and Systems
language:en
Short-container-title:IEICE Trans. Inf. & Syst.

Author:

LE Yi-ze¹²,FENG Yong¹²,LIU Da-jiang¹²,QIANG Bao-hua³⁴

Affiliation:

1. College of Computer Science, Chongqing University

2. Key Laboratory of Dependable Service Computing in Cyber Physical Society, Ministry of Education, Chongqing University

3. Guangxi Key Laboratory of Trusted Software, Guilin University of Electronic Technology

4. Guangxi Key Laboratory of Optoelectronic Information Processing, Guilin University of Electronic Technology

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Artificial Intelligence,Electrical and Electronic Engineering,Computer Vision and Pattern Recognition,Hardware and Architecture,Software

Link

https://www.jstage.jst.go.jp/article/transinf/E103.D/6/E103.D_2019EDP7278/_pdf

Reference22 articles.

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3. [3] J. Zhou, P. Yu, W. Tang, and Y. Wu, “Efficient online local metric adaptation via negative samples for person re-identification,” Proc. IEEE International Conference on Computer Vision, pp.2420-2428, 2017. 10.1109/iccv.2017.265

4. [4] H.-X. Yu, A. Wu, and W.-S. Zheng, “Cross-view asymmetric metric learning for unsupervised person re-identification,” Proc. IEEE International Conference on Computer Vision, pp.994-1002, 2017. 10.1109/iccv.2017.113

5. [5] Z. Liu, D. Wang, and H. Lu, “Stepwise metric promotion for unsupervised video person re-identification,” Proc. IEEE International Conference on Computer Vision, pp.2429-2438, 2017. 10.1109/iccv.2017.266