A Fault-Tolerant Architecture with Error Correcting Code for the Instruction-Level Temporal Redundancy

Author:

YAN Chao1,DAI Hongjun1,CHEN Tianzhou2

Affiliation:

1. Department of Computer Science and Technology, Shandong University

2. Department of Computer Science and Technology, Zhejiang University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Artificial Intelligence,Electrical and Electronic Engineering,Computer Vision and Pattern Recognition,Hardware and Architecture,Software

Reference18 articles.

1. Soft errors in advanced semiconductor devices-part I: the three radiation sources

2. [2] S. Borkar, P. Dubey, K. Kahn, D. Kuck, H. Mulder, S. Pawlowski, and J. Rattner, “Platform 2015: Intel processor and platform evolution for the next decade,” Intel White Paper, Intel, March 2005.

3. [3] M. Franklin, “A study of time redundant fault tolerance techniques for superscalar processors,” Defect and Fault Tolerance in VLSI Systems, 1995. Proceedings., 1995 IEEE International Workshop on,, pp.207-215, Nov. 1995.

4. [4] A. Parashar, S. Gurumurthi, and A. Sivasubramaniam, “A complexity-effective approach to alu bandwidth enhancement for instruction-level temporal redundancy,” Proc. 31st Annual International Symposium on, Computer Architecture, pp.376-386, June 2004.

5. [5] D. Borodin and B. Juurlink, “Instruction precomputation with memoization for fault detection,” Design, Automation Test in Europe Conference Exhibition (DATE), 2010, pp.1665-1668, March 2010.

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