Affiliation:
1. Graduate School of Advanced Integration Science, Chiba University
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Artificial Intelligence,Electrical and Electronic Engineering,Computer Vision and Pattern Recognition,Hardware and Architecture,Software
Reference21 articles.
1. Characterization of soft errors caused by single event upsets in CMOS processes
2. [2] S. Mitra, N. Seifert, M. Zhang, Q. Shi, and K.S. Kim, “Robust system design with built-in soft-error resilience,” IEEE Des. & Test Comput., vol.38, no.2, pp.43-52, Feb. 2005.
3. [3] S. Krishnamohan and N.R. Mahapatra, “Analysis and design of soft-error hardened latches,” Proc. Great Lakes Symp. VLSI Des., pp.328-331, 2005.
4. [4] S. Mitra, M. Zhang, S. Waqas, N. Seifert, B. Gill, and K.S. Kim, “Combinational logic soft error correction,” Proc. IEEE Int'l Test Conf., pp.824-832, 2006.
5. [5] S. Mitra, M. Zhang, T.M. Mak, N. Seifert, V. Zia, and K.S. Kim, “Logic soft errors: a major barrier to robust platform design,” Proc. IEEE Int'l Test Conf., pp.687-698, 2005.