A Novel Approach to Address External Validity Issues in Fault Prediction Using Bandit Algorithms

Author:

HAYAKAWA Teruki1,TSUNODA Masateru1,TODA Koji2,NAKASAI Keitaro3,TAHIR Amjed4,BENNIN Kwabena Ebo5,MONDEN Akito6,MATSUMOTO Kenichi3

Affiliation:

1. Kindai University

2. Fukuoka Institute of Technology

3. Nara Institute of Science and Technology

4. Massey University

5. Wageningen University & Research

6. Okayama University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Artificial Intelligence,Electrical and Electronic Engineering,Computer Vision and Pattern Recognition,Hardware and Architecture,Software

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Preliminary Analysis of Review Method Selection Based on Bandit Algorithms;2022 29th Asia-Pacific Software Engineering Conference (APSEC);2022-12

2. Using bandit algorithms for selecting feature reduction techniques in software defect prediction;Proceedings of the 19th International Conference on Mining Software Repositories;2022-05-23

3. Using Bandit Algorithms for Project Selection in Cross-Project Defect Prediction;2021 IEEE International Conference on Software Maintenance and Evolution (ICSME);2021-09

4. Does class size matter? An in-depth assessment of the effect of class size in software defect prediction;Empirical Software Engineering;2021-07-22

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