Affiliation:
1. Sadjad Higher Education Institute
2. School of Engineering, Deakin University
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. [1] W. S. H. Wong and L. C. Hung, “Longer MEMS switch lifetime using novel dual-pulse actuation voltage,” IEEE Trans. Device Mater. Rel., vol. 9, no. 4, pp. 569-575, Dec. 2009.
2. [3] A. L. Hartzell, M. G. da Silva, and H. R. Shea, MEMS Reliability, Springer, New York, 2011.
3. [4] G. M. Rebeiz, RF MEMS Theory, Design, and Technology, New Jersey, John Wiley & Sons, 2003.
4. [5] C. Goldsmith, J. Maciel, and J. McKillop, “Demonstrating reliability,” IEEE Microw. Mag., vol. 8, pp. 56-60, Dec. 2007.
5. [6] C. Goldsmith, J. Ehmke, A. Malczewski, B. Pillans, S. Eshelman, Z. Yao, J. Brank, and M. Eberly, “Lifetime characterization of capacitive RF MEMS switches,” 2001 IEEE MTT-S International Microwave Symposium Digest, Phoenix, United States, pp. 227-230, May 2001.
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献