Nonlinear inter-stage gain calibration for pipelined ADCs employing double dithering modes-Reference-Cited by-同舟云学术

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Nonlinear inter-stage gain calibration for pipelined ADCs employing double dithering modes

Published:2014 Issue:23 Volume:11 Page:20140995-20140995
ISSN:1349-2543
Container-title:IEICE Electronics Express
language:en
Short-container-title:IEICE Electron. Express

Author:

Chaojie Fan¹,Ke Wang¹,Wenjie Pan¹,Jianjun Zhou¹

Affiliation:

1. School of Microelectronics, Shanghai Jiaotong University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://www.jstage.jst.go.jp/article/elex/11/23/11_11.20140995/_pdf

Reference5 articles.

1. [1] L. X. Shi, W. Zhao, J. H. Wu and C. Chen: IEEE Trans. Circuits Syst. II, Exp. Briefs 59 (2012) 239. DOI:10.1109/TCSII.2012.2188461

2. [2] A. Panigada and I. Galton: IEEE Trans. Circuits Syst. I, Reg. Papers 53 (2006) 1885. DOI:10.1109/TCSI.2006.880034

3. [3] C. J. Fan, Y. X. Lu, K. Wang and J. J. Zhou: IEICE Electron. Express 11 (2014) 20140442. DOI:10.1587/elex.11.20140442

4. [4] Y. S. Shu and B. S. Song: IEEE J. Solid-State Circuits 43 (2008) 342. DOI:10.1109/JSSC.2007.914260

5. [5] H. van der Ploeg, G. Hoogzaad, H. A. H. Termeer, M. Vertregt and R. L. J. Roover: IEEE J. Solid-State Circuits 36 (2001) 1859. DOI:10.1109/4.972136

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