Reliable and low error dual modular redundancy FIR filter with wide protection window-Reference-Cited by-同舟云学术

Reliable and low error dual modular redundancy FIR filter with wide protection window

Published:2014 Issue:9 Volume:11 Page:20140183-20140183
ISSN:1349-2543
Container-title:IEICE Electronics Express
language:en
Short-container-title:IEICE Electron. Express

Author:

Wey I-Chyn¹,Peng Chien-Chang²,Chou Heng-Jui³,Chen Po-Tsang³

Affiliation:

1. Graduate Institute of Electrical Engineering, Electrical Engineering Department, and Green Technology Research Center, School of Electrical and Computer Engineering, College of Engineering, Chang-Gung University

2. Graduate Institute of Electrical Engineering, School of Electrical and Computer Engineering, College of Engineering, Chang-Gung University

3. Electrical Engineering Department, School of Electrical and Computer Engineering, College of Engineering, Chang-Gung University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://www.jstage.jst.go.jp/article/elex/11/9/11_11.20140183/_pdf

Reference7 articles.

1. Design for soft error mitigation

2. Impact of Scaling on Neutron-Induced Soft Error in SRAMs From a 250 nm to a 22 nm Design Rule

3. Latch Susceptibility to Transient Faults and New Hardening Approach

4. [4] R. Hentschke, F. Marques, F. Lima, L. Carro, A. Susin and R. Reis: Proc. of Symp. on Integr. Circuits Syst. Des. (2002) 95.

5. Fault Tolerance in Transform-Domain Adaptive Filters Operating With Real-Valued Signals

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