Analysis on the application of on-chip redundancy in the safety-critical system-Reference-Cited by-同舟云学术

Analysis on the application of on-chip redundancy in the safety-critical system

Published:2014 Issue:9 Volume:11 Page:20140153-20140153
ISSN:1349-2543
Container-title:IEICE Electronics Express
language:en
Short-container-title:IEICE Electron. Express

Author:

Cai Bai-gen¹,Jin Cheng-ming¹,Ma Lian-chuan¹,Cao Yuan¹,Nakamura Hideo²

Affiliation:

1. The School of Electronic and Information Engineering, Beijing Jiaotong Univeristy

2. The Department of Electronic and Computer Science, College of Science and Technology, Nihon University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://www.jstage.jst.go.jp/article/elex/11/9/11_11.20140153/_pdf

Reference7 articles.

1. [1] R. Girardey, M. Hübner and J. Becker: IEEE Annual Symposium on VLSI (2010) 469. DOI:10.1109/ISVLSI.2010.11

2. [2] R. Mariani and P. Fuhrmann: IEEE International Symposium on DFTVS (2007) 123.

3. [3] International Electrotechnical Commission: IEC 61508 Second Edition: Functional Safety of Electrical/Electronic/Programmable Electronic Systems[S]. Geneva: IEC (2010).

4. [4] S. Hauge, S. Håbrekke and M. A. Lundteigen: Reliability Prediction Method for Safety Instrumented Systems PDS Example collection [R]. Norway: SINTEF (2010).

5. [5] P. Hokstad, S. Håbrekke, M. A. Lundteigen and T. Onshus: Use of the PDS Method for Railway Applications[R]. Norway: SINTEF Technology and Society (2009) 15.

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Reliability-Oriented Configuration Optimization of More Electrical Control Systems;Aerospace;2022-02-06