Compact Modeling of Injection Enhanced Insulated Gate Bipolar Transistor Valid for Optimization of Switching Frequency

Author:

YAMAMOTO Takao1,MIYAKE Masataka2,FELDMANN Uwe2,JÜRGEN MATTAUSCH Hans2,MIURA-MATTAUSCH Mitiko2

Affiliation:

1. DENSO Corporation

2. Hiroshima University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Reference25 articles.

1. [1] A. Nakagawa, Y. Yamaguchi, K. Watanabe, and H. Ohashi, “Safe operating area for 1200-V nonlatchup bipolar-mode MOSFET's,” IEEE Trans. Electron. Dev., vol.34, no.2, pp.351–355, Feb. 1987.

2. [2] A. R. Hefner and D. M. Diebolt, “An experimentally verified IGBT model implemented in the Saber circuit simulator,” IEEE Trans. Power Electron., vol.9, p.532, Sept. 1994.

3. [3] T. Ueta, M. Nagao, and K. Hamada, “Application of electrical circuit simulations in hybrid vehicle development,” IEEE Trans. Electron. Dev., vol.60, no.2, pp.544–550, Feb. 2013.

4. [4] H. Takahashi, H. Haruguchi, H. Hagino, and T. Yahata, “Carrier stored trench-gate bipolar transistor (CSTBT): a novel power device for high voltage application,” Proc. Power Semiconductor Devices and ICs, p.1502, 1996.

5. [5] M. Mouri, Y. Uchimo, J. Sakano, and H. Kobayashi, “A novel high-conductivity IGBT study with square short circuit SOA,” Proc. Power Semiconductor Devices and ICs, Kyoto, Japan, p.433, 1998.

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