Contact Mechanisms and Contact Resistance Characteristics of Solid Tin and Plated Tin Contacts Used for Connectors-Reference-Cited by-同舟云学术

Contact Mechanisms and Contact Resistance Characteristics of Solid Tin and Plated Tin Contacts Used for Connectors

Published:2010 Issue:5 Volume:E93-C Page:670-677
ISSN:0916-8524
Container-title:IEICE Transactions on Electronics
language:en
Short-container-title:IEICE Trans. Electron.

Author:

TAMAI Terutaka¹,SAWADA Shigeru¹,HATTORI Yasuhiro²

Affiliation:

1. Graduate School of Engineering, Laboratory of Vehicle Network Technology, Mie University

2. Basic Technology R&D Department, AutoNetworks Technology, Ltd.

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://www.jstage.jst.go.jp/article/transele/E93.C/5/E93.C_5_670/_pdf

Reference14 articles.

1. [1] S.J. Krumbein, “Contact properties of tin plates, ” Proc. IEEE-Holm Conf. Electrical Contacts, pp.38-49, Oct. 1974.

2. [2] M. Antler, W.F. Graddick, and H.G. Tompkins, “Base metal contacts: An exploratory study of separable connection to tin-lead, ” IEEE Trans. Parts Hybrids Packag., vol.PHP-11, no.1, pp.37-44, 1975.

3. [3] M. Antler, “Survey of contact fretting in electrical connectors, ” Proc. 17th Inst. Conf. Electrical Contacts, pp.3-22, Chicago, 1994.

4. [4] R.D. Marucci, “Possible mechanism for observed dynamic resistance, ” Proc. IEEE-Holm Conf. Electrical Contacts, pp.254-267, Chicago, 2000.

5. [5] T. Ito, S. Sawada, Y. Hattori, Y. Saito, T. Tamai, and K. Iida, “Micro-structural study of fretting contact caused by the differences of the tin plating thickness, ” Proc. IS-EMD 2007, EMD-71, pp.13-18, Hamamatsu, 2007.

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