Predicting Analog Circuit Performance Based on Importance of Uncertainties-Reference-Cited by-同舟云学术

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Predicting Analog Circuit Performance Based on Importance of Uncertainties

Published:2010 Issue:6 Volume:E93-C Page:893-904
ISSN:0916-8524
Container-title:IEICE Transactions on Electronics
language:en
Short-container-title:IEICE Trans. Electron.

Author:

SUN Jin¹,POTLURI Kiran²,WANG Janet M.¹

Affiliation:

1. Department of Electrical and Computer Engineering, University of Arizona

2. Texas Instruments

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://www.jstage.jst.go.jp/article/transele/E93.C/6/E93.C_6_893/_pdf

Reference25 articles.

1. [1] P.G. Drennan and M.L. Kniffin, “Implications of proximity effects for analog design,” Proc. CICC, pp.169-176, 2006.

2. Understanding MOSFET mismatch for analog design

3. [3] K. Shepard and D. Maynard, “Variability and yield improvement-rules, models, and characterization,” Proc. ICCAD, pp.834-835, 2006.

4. [4] I. Vytyaz, D. Lee, P. Hanumolu, U. Moon, and K. Mayaram, “Sensitivity analysis for oscillators,” Proc. ICCAD, pp.458-463, 2007.

5. [5] D. Grabowski, M. Olbrich, and E. Barke, “Analog circuit simulation using range arithmetics,” Proc. ASPDAC, pp.762-767, 2008.

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