Slit-Mura Detection through Non-contact Optical Measurements of In-Line Spectrometer for TFT-LCDs

Author:

TZU Fu-Ming1,CHOU Jung-Hua1

Affiliation:

1. National Cheng Kung University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Reference20 articles.

1. [1] K. Nakashima, “Hybrid inspection system for LCD color filter panels, ” Instrument and Measurement Technology Conference, IMTC94, Advanced Technologies in I&M, 1994 IEEE, vol.2, pp.689-692, 1994.

2. [2] M. Shimizu, A. Ishii, and N.T. Nishimura, “Detection of foreign material included in LCD panels, ” Industrial Electronics Society, IECON 2000, 26th Annual Conference of IEEE, vol.2, pp.836-841, 2000.

3. [3] K. Taniguchi, K. Ueta, and S. Tatsumi, “A detection method for irregular lightness variation of low contrast, ” Systems, Man and Cybernetics, 2004 IEEE International Conference, vol.7, pp.6401-6406, 2004.

4. [4] J.Y. Lee and S.I. Yoo, “Automatic detection on region-Mura defect in TFT-LCD, ” IEICE Trans. Inf. & Syst., vol.E87-D, no.10, pp.2371-2378, Oct. 2004.

5. [5] Video Electronic Standards Association (VESA): Flat panel display measurement standard, version 2.0.

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