Prediction of DC-AC Converter Efficiency Degradation due to Device Aging Using a Compact MOSFET-Aging Model-Reference-Cited by-同舟云学术

Prediction of DC-AC Converter Efficiency Degradation due to Device Aging Using a Compact MOSFET-Aging Model

Published:2020-03-01 Issue:3 Volume:E103.C Page:119-126
ISSN:0916-8524
Container-title:IEICE Transactions on Electronics
language:en
Short-container-title:IEICE Trans. Electron.

Author:

SATO Kenshiro¹,NAVARRO Dondee²,SEKIZAKI Shinya³,ZOKA Yoshifumi³,YORINO Naoto³,MATTAUSCH Hans Jürgen²,MIURA-MATTAUSCH Mitiko²

Affiliation:

1. Graduate School of Advanced Sciences of Matter, Hiroshima University

2. HiSIM Research Center, Hiroshima University

3. Graduate School of Engineering, Hiroshima University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.jstage.jst.go.jp/article/transele/E103.C/3/E103.C_2019ECP5010/_pdf

Reference28 articles.

1. [1] S.B. Naderi, M. Negnevitsky, A. Jalilian, and M.T. Hagh, “Efficient fault ride-through scheme for three phase voltage source inverter-interfaced distributed generation using DC link adjustable resistive type fault current limiter,” Renewable Energy, vol.92, pp.484-498, July 2016. 10.1016/j.renene.2016.02.016

2. [2] R.L. Steigerwald, R.W. De Doncker, and M.H. Kheraluwala, “A comparison of high-power DC-DC soft-switched converter topologies,” IEEE Trans. Ind. Appl., vol.32, no.5, pp.1139-1145, Sept./Oct. 1996. 10.1109/28.536876

3. [3] H. Matsunami, N. Ootani, T. Kimoto, and T. Nakamura, “Technology of semiconductor SiC and its application,” The Nikkan Kogyo Shimbun, Tokyo, Japan, pp.9-22, 2011.

4. [4] K. Ino, “New era of power electronics by SiC power devices evolution,” Proc. Inter. Conf. on Planarization/CMP Technology, Kobe, Japan, p.4, 2014. 10.1109/icpt.2014.7017231

5. [5] J.D. Van Wyk and F.C. Lee, “On a future for power electronics,” IEEE Journal of Emerging and Selected Topics in Power Electron., vol.1, no.2, pp.59-72, June 2013. 10.1109/jestpe.2013.2271499

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Reliability-aware Control of Power Converters in Mobility Applications;2024 European Control Conference (ECC);2024-06-25

2. Reliability and Lifetime Optimal Control for Electric Vehicle Power Converters;IEEE Control Systems Letters;2024

3. Enhancing Efficiency and Reliability of Electric Vehicles via Adaptive E-Gear Control;2023 IEEE 26th International Conference on Intelligent Transportation Systems (ITSC);2023-09-24

4. An Overview on Electric-Stress Degradation Empirical Models for Electrochemical Devices in Smart Grids;Energies;2021-04-10