Analysis of Antenna Performance Degradation due to Coupled Electromagnetic Interference from Nearby Circuits
Author:
Affiliation:
1. Department of Electrical and Computer Engineering, Sungkyunkwan University
2. Design Technology Team, Memory Division, Samsung Electronics Co. Ltd.
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
https://www.jstage.jst.go.jp/article/transele/E103.C/3/E103.C_2019ECP5019/_pdf
Reference13 articles.
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2. [2] H.-D. Kang, T.-H. Chung, C.-H. Jun, and J.-G. Yook, “Performance enhancement of degenerated antenna system due to external digital circuits,” IEEE Electrical Design of Advanced Packaging & Systems Symposium (EDAPS), pp.1-4, Dec. 2010. DOI: 10.1109/EDAPS.2010.5683005 10.1109/edaps.2010.5683005
3. [3] S. Grivet-Talocia, M. Bandinu, F. Canavero, I. Kelander, and P.Kotiranta, “Fast Evaluation of Electromagnetic Interference Between Antenna and PCB Traces for Compact Mobile Devices,” 2008 IEEE International Symposium on Electromagnetic Compatibility, pp.1-5, Aug. 2008. DOI: 10.1109/ISEMC.2008.4652050 10.1109/isemc.2008.4652050
4. [4] H. Lee, J. Yousaf, J. Kim, J. Youn, D. Lee, C. Hwang, and W. Nah, “Analysis of antenna performance degradation due to VCO source using active S-parameters,” EMC Europe 2018, Netherlands,Amsterdam, Aug. 2018. DOI: 10.1109/EMCEurope.2018.8485062 10.1109/emceurope.2018.8485062
5. [5] H. Lee, K. Kim, J. Yousaf, J. Youn, D. Lee, C. Hwang, and W. Nah, “Analysis of electromagnetic field interference between an antenna and a multiple-noise source using active scattering parameters,” 2017 IEEE International Symposium on Electromagnetic Compatibility, Washington DC, USA, Aug. 2017. DOI: 10.1109/ISEMC.2017.8077947 10.1109/isemc.2017.8077947
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