Response-Time Acceleration of a Frontend Amplifier for High Output Impedance Sensors

Author:

MARS Kamel1,KAWAHITO Shoji2

Affiliation:

1. Department of Nanovision Technology, Graduate School of Science and Technology, Shizuoka University

2. Imaging Devices Laboratory, Research Institute of Electronics, Shizuoka University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. [1] A. Krymski, N. Khaliullin, and H. Rhodes, “A 2e noise 1.3 megapixel CMOS sensor,” Proc. IEEE Workshop CCD and Advanced Image Sensors, Elmau, Germany, June 2003.

2. Noise Analysis of High-Gain, Low-Noise Column Readout Circuits for CMOS Image Sensors

3. [3] B. Fowler, C. Liu, S. Mims, J. Balicki, W. Li, H. Do, and P. Vu, “Wide dynamic range low light level CMOS image sensors,” 2009 International Image Sensor Workshop, Paper 48, 2009.

4. [4] T. Kanno and M. Saga, “Uncooled infrared focal plane array having 128×128 thermopile detector elements,” Proc. SPIE, vol.2269, pp.450-459, 1994.

5. [6] K. Mars and S. Kawahito, “Low-noise readout circuits with a response time acceleration technique for high output impedance sensors,” 2010 IEEE Asia Pacific Conference on Circuits and Systems, pp.1159-1162, 2010.

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