1. [1] C. Poivey, S. Buchner, J. Howard, K. LaBel, and R. Pease, “Testing and Hardness Assurance Guidelines for Single Event Transients (SET) in Linear Devices,” Rep. NASA GSFC, pp.1-36, 2005.
2. [2] J.R. Schwank, “Basic Mechanisms of Radiation Effects in the Natural Space Environment,” Notes of the Short Course of the IEEE NSREC, pp.1-91, 1994.
3. [3] P.E. Dodd, “Basic Mechanisms for Single-Event Effects,” NSREC Short Course, pp.1-85, 1999.
4. [4] F.W. Sexton, “Destructive single-event effects in semiconductor devices and ICs,” IEEE Trans. Nucl. Sci., vol.50, no.3, pp.603-621, 2003. 10.1109/tns.2003.813137
5. [5] R. Koga, S.H. Penzin, K.B. Crawford, and W.R. Crain, “Single event functional interrupt (SEFI) sensitivity in microcircuits,” Proc. 4th Eur. Conf. RADECS, pp.311-318, 1997. 10.1109/radecs.1997.698915