Robust Defect Size Measurement Using 3D Modeling for LCD Defect Detection in Automatic Vision Inspection System-Reference-Cited by-同舟云学术

Robust Defect Size Measurement Using 3D Modeling for LCD Defect Detection in Automatic Vision Inspection System

Published:2010 Issue:6 Volume:E93-C Page:922-928
ISSN:0916-8524
Container-title:IEICE Transactions on Electronics
language:en
Short-container-title:IEICE Trans. Electron.

Author:

JOO Young-Bok¹,HAN Chan-Ho²,PARK Kil-Houm³

Affiliation:

1. Department of Computer Science, Yonsei University

2. Department of Broadcasting Visual Technology, Kangwon National University

3. School of Electrical Engineering and Computer Science, Kyungpook National University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://www.jstage.jst.go.jp/article/transele/E93.C/6/E93.C_6_922/_pdf

Reference10 articles.

1. A survey on industrial vision systems, applications and tools

2. [2] R. Sablatnig, “A flexible concept for automatic visual inspection,” Proc. Czech Pattern Recognition Workshop'97 (CPRW'97), 1997.

3. [3] J.H.N. Mattick, R.W. Kelsall, and R.E. Miles, “Improved critical area prediction by application of pattern recognition techniques,” Microelectronics Robustness, vol.36, no.11-12, pp.1815-1818, Dec. 1996.

4. Automatic thresholding for defect detection

5. [5] U.S. Khan, J. Iqbal, and M.A. Khan, “Automatic inspection system using machine vision,” 34th Applied Imagery and Pattern Recognition Workshop, pp.210-217, April 2005.

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