Numerical Analysis of the Effect of Thin-Film Thickness and Material in Field Mapping of Eddy-Current Probes Using Photoinductive Technique
Author:
Affiliation:
1. National Cheng Kung University
2. Kun Shan University
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://www.jstage.jst.go.jp/article/transele/E95.C/1/E95.C_1_86/_pdf
Reference17 articles.
1. [1] J.C. Moulder, N. Nakagawa, K.S. No, Y.P. Lee, and J.F. McClelland, “Photoinductive imaging: A new nde technique,” in Review of progress in quantitative nondestructive evaluation, eds. D.O. Thompson and D.E. Chimenti, pp.599-611, Plenum Press, New York, 1989.
2. [4] N. Nakagawa and J.C. Moulder, “Eddy current probe calibration via the photoinductive effect,” NDT&E International, vol.28, no.4, pp.245-246, 1995.
3. [5] M.S. Hughes, J.C. Moulder, M.W. Kubovich, and B.A. Auld, “Mapping eddy current probe fields using the photoinductive effect,” NDT&E International, vol.28, no.4, p.251, 1995.
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