Shared Write-Selection Transistor Cell and Leakage-Replication Read Scheme for Large Capacity MRAM Macros-Reference-Cited by-同舟云学术

Shared Write-Selection Transistor Cell and Leakage-Replication Read Scheme for Large Capacity MRAM Macros

Published:2009 Issue:4 Volume:E92-C Page:417-422
ISSN:0916-8524
Container-title:IEICE Transactions on Electronics
language:en
Short-container-title:IEICE Trans. Electron.

Author:

NEBASHI Ryusuke¹,SAKIMURA Noboru¹,SUGIBAYASHI Tadahiko¹,KASAI Naoki¹

Affiliation:

1. Device Platforms Laboratories, NEC Corporation

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://www.jstage.jst.go.jp/article/transele/E92.C/4/E92.C_4_417/_pdf

Reference6 articles.

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