Low-overhead, one-cycle timing-error detection and correction technique for flip-flop based pipelines

Author:

Koo Jongeun1,Park Eunhyeok2,Kim Dongyoung2,Park Junki1,Ryu Sungju1,Yoo Sungjoo2,Kim Jae-Joon1

Affiliation:

1. Pohang University of Science and Technology (POSTECH)

2. Seoul National University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference30 articles.

1. [1] S. Nassif, et al.: “High performance CMOS variability in the 65 nm regime and beyond,” IEEE International Electron Devices Meeting (2007) 569 (DOI: 10.1109/IEDM.2007.4419002).

2. [2] A. Muhtaroglu, et al.: “On-die droop detector for analog sensing of power supply noise,” IEEE J. Solid-State Circuits 39 (2004) 651 (DOI: 10.1109/JSSC.2004.825120).

3. [3] M. Nakai, et al.: “Dynamic voltage and frequency management for a low-power embedded microprocessor,” IEEE J. Solid-State Circuits 40 (2005) 28 (DOI: 10.1109/JSSC.2004.838021).

4. [4] M. Agarwal, et al.: “Circuit failure prediction and its application to transistor aging,” IEEE VLSI Test Symposium (2007) 277 (DOI: 10.1109/VTS.2007.22).

5. [5] J. Tschanz, et al.: “Adaptive frequency and biasing techniques for tolerance to dynamic temperature-voltage variations and aging,” ISSCC Dig. Tech. Papers (2007) 292 (DOI: 10.1109/ISSCC.2007.373409).

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