Radiation-enhanced channel length modulation induced by trapped charges in buried oxide layer-Reference-Cited by-同舟云学术

Radiation-enhanced channel length modulation induced by trapped charges in buried oxide layer

Published:2019 Issue:21 Volume:16 Page:20190454-20190454
ISSN:1349-2543
Container-title:IEICE Electronics Express
language:en
Short-container-title:IEICE Electron. Express

Author:

Xie Xin¹²³,Zhu Huilong¹²,Zhang Mengying¹²,Bi Dawei¹,Hu Zhiyuan¹,Zhang Zhengxuan¹,Zou Shichang¹

Affiliation:

1. State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences

2. University of Chinese Academy of Sciences

3. Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://www.jstage.jst.go.jp/article/elex/16/21/16_16.20190454/_pdf

Reference33 articles.

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