Power-up control techniques for reliable SRAM PUF-Reference-Cited by-同舟云学术

Power-up control techniques for reliable SRAM PUF

Published:2019 Issue:13 Volume:16 Page:20190296-20190296
ISSN:1349-2543
Container-title:IEICE Electronics Express
language:en
Short-container-title:IEICE Electron. Express

Author:

Lee Juyun¹,Jee Dong-Woo²,Jeon Dongsuk¹

Affiliation:

1. Graduate School of Convergence and Science Technology, Seoul National University

2. Dept. of Electrical and Computer Engineering, Ajou University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://www.jstage.jst.go.jp/article/elex/16/13/16_16.20190296/_pdf

Reference30 articles.

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2. [2] R. Helinski, et al.: “A physical unclonable function defined using power distribution system equivalent resistance variations,” DAC (2009) 676 (DOI: 10.1145/1629911.1630089).

3. [3] S. K. Mathew, et al.: “A 0.19 pJ/b PVT-variation-tolerant hybrid physically unclonable function circuit for 100% stable secure key generation in 22 nm CMOS,” ISSCC Dig. Tech. Papers (2014) 278 (DOI: 10.1109/ISSCC.2014.6757433).

4. [4] Y. Su, et al.: “A digital 1.6 pJ/bit chip identification circuit using process variations,” IEEE J. Solid-State Circuits 43 (2008) 69 (DOI: 10.1109/JSSC.2007.910961).

5. [5] G. Li, et al.: “High performance bistable weak physical unclonable function for IoT security,” IEICE Electron. Express 15 (2018) 20180879 (DOI: 10.1587/elex.15.20180879).

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