Single event upset failure probability evaluation and periodic scrubbing techniques for hierarchical parallel vision processors-Reference-Cited by-同舟云学术

Single event upset failure probability evaluation and periodic scrubbing techniques for hierarchical parallel vision processors

Published:2019 Issue:21 Volume:16 Page:20190544-20190544
ISSN:1349-2543
Container-title:IEICE Electronics Express
language:en
Short-container-title:IEICE Electron. Express

Author:

Di Qian¹²,Zhang Zhongxing¹²,Li Honglong¹²,Zhang Zhao¹²,Feng Peng¹²,Wu Nanjian¹²³

Affiliation:

1. State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences

2. Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences

3. Center for Excellence in Brain Science and Intelligence Technology, Chinese Academy of Sciences

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://www.jstage.jst.go.jp/article/elex/16/21/16_16.20190544/_pdf

Reference30 articles.

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