Influence of cable length between TLP test system and DUT and its correction for CMCESD saturation measurement
Author:
Affiliation:
1. Nagoya Institute of Technology
2. Noise Laboratory Co., LTD.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
General Medicine
Link
https://www.jstage.jst.go.jp/article/comex/12/9/12_2023XBL0064/_pdf
Reference6 articles.
1. [1] IEC 62228-5 Ed.1,“Integrated circuits -- EMC evaluation of transceivers -- Part 5: Ethernet transceivers.” DOI: 10.3403/30378234
2. [2] OPEN Alliance, “IEEE 100BASE-T1 EMC Test Specification for Common Mode Chokes,” Version 2.0, June 2020.
3. [3] OPEN Alliance, “IEEE 1000BASE-T1 EMC Test Specification for Common Mode Chokes,” Version 2.0, June 2020.
4. [4] IEC 62615 Ed.1,“Electrostatic discharge sensitivity testing - Transmission line pulse (TLP) - Component level.” DOI: 10.3403/30195575
5. [5] S. Bub, M. Mergens, A. Hardock, S. Holland, and A. Hilbrink, “Automotive high-speed interfaces: Future challenges for system-level HV-ESD protection and first-time-right design,” 2021 43rd Annual EOS/ESD Symposium (EOS/ESD), pp. 1-10, Tucson, AZ, USA, Sept. 2021. DOI: 10.23919/EOS/ESD52038.2021.9574746
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