Affiliation:
1. Lane Department of Computer Science and Electrical Engineering
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference10 articles.
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3. Quiescent current sensor circuits in digital VLSI CMOS testing
4. Iddq testing for CMOS VLSI
5. Design-for-testability techniques for detecting delay faults in CMOS/BiCMOS logic families