The Effects of Sensor Spectral Sensitivity, Pixel Pitch, Photon Shot Noise, and Dark Noise on Perceived Image Quality

Author:

KUNIBA Hideyasu1,BERNS Roy S.2

Affiliation:

1. Nikon Corporation

2. Munsell Color Science Laboratory, Center for Imaging Science, Rochester Institute of Technology

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Applied Mathematics,Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Signal Processing

Reference20 articles.

1. [1] “Casio's QV-10: Portable presentations, ” Byte.com, <http://www.byte.com/art/9510/sec10/art10.htm>

2. [2] H. Tamayama, K. Ito, and T. Nishimura, “Technology trends of high-definition digital still camera systems, ” 2002 Symposium On VLSI Circuits Digest of Technical Papers, pp.100-105, 2002.

3. [3] P.B. Catrysse and B.A. Wandell, “Roadmap for CMOS image sensors: Moore meets Planck and Sommerfeld, ” Proc. SPIE-IS&T Electronic Imaging SPIE5678, pp.1-13, 2005.

4. [4] Y. Nitta, Y. Muramatsu, K. Amano, T. Toyama, J. Yamamoto, K. Mishina, A. Suzuki, T. Taura, A. Kato, M. Kikuchi, Y. Yasui, H. Nomura, and N. Fukushima, “High-speed digital double sampling with analog CDS on column parallel ADC architecture for low-noise active pixel sensor, ” Solid-State Circuits Conference, 2006. ISSCC 2006. Digest of Technical Papers. IEEE International, pp.2024-2031, Feb. 2006.

5. [5] T. Noda, H. Takahashi, M. Shinohara, T. Watanabe, R. Mishima, T. Matuda, S. Takimoto, S. Nishimura, T. Endo, K. Sakurai, H. Yuzurihara, and S. Inoue, “A 1/2.7-inch CMOS image sensor for full high-definitioncamcorders, ” ITE Technical Report, vol.31, no.21, pp.17-20, March 2007.

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