Formulation of a Test Pattern Measure That Counts Distinguished Fault-Pairs for Circuit Fault Diagnosis-Reference-Cited by-同舟云学术

Formulation of a Test Pattern Measure That Counts Distinguished Fault-Pairs for Circuit Fault Diagnosis

Published:2020-12-01 Issue:12 Volume:E103.A Page:1456-1463
ISSN:0916-8508
Container-title:IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
language:en
Short-container-title:IEICE Trans. Fundamentals

Author:

INAMOTO Tsutomu¹,HIGAMI Yoshinobu¹

Affiliation:

1. Graduate School of Science and Engineering, Ehime University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Applied Mathematics,Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Signal Processing

Link

https://www.jstage.jst.go.jp/article/transfun/E103.A/12/E103.A_2020VLP0007/_pdf

Reference16 articles.

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3. [3] Y. Higami, S. Wang, H. Takahashi, and K.K. Saluja, “Adaptive field diagnosis for reducing the number of test patterns,” Proc. International Technical Conference on Circuits/Systems, Computers and Communications, pp.412-415, July 2017.

4. [4] C. Xue and R. Blanton, “Test-set reordering for improving diagnosability,” Proc. 2017 IEEE 35th VLSI Test Symposium (VTS), pp.1-6, 2017. 10.1109/vts.2017.7928926

5. [5] K.Y. Cho and E.J. McCluskey, “Test set reordering using the gate exhaustive test metric,” Proc. 25th IEEE VLSI Test Symposium (VTS'07), pp.199-204, 2007. 10.1109/vts.2007.79