One-Shot Voltage-Measurement Circuit Utilizing Process Variation-Reference-Cited by-同舟云学术

One-Shot Voltage-Measurement Circuit Utilizing Process Variation

Published:2009 Issue:4 Volume:E92-A Page:1024-1030
ISSN:0916-8508
Container-title:IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
language:en
Short-container-title:IEICE Trans. Fundamentals

Author:

UEZONO Takumi¹,SATO Takashi¹,MASU Kazuya¹

Affiliation:

1. Integrated Research Institute, Tokyo Institute of Technology

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Applied Mathematics,Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Signal Processing

Link

http://www.jstage.jst.go.jp/article/transfun/E92.A/4/E92.A_4_1024/_pdf

Reference10 articles.

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2. [2] M. Takamiya, M. Mizuno, and K. Nakamura, “An on-chip, 100-GHz sampling rate, 8-channel sampling oscilloscope macro with embedded sampling clock generator, ” IEEE Int. Solid-State Circuits Conf. (ISSCC) Dig. Tech. Papers, pp.182-183, Feb. 2002.

3. [3] Y. Ogasahara, M. Hashimoto, and T. Onoye, “Dynamic supply noise measurement with all digital gated oscillator for evaluating decoupling capacitance effect, ” Proc. CICC, pp.783-786, Sept. 2007.

4. [4] Y. Kanno, Y. Kondoh, T. Irita, K. Hirose, R. Mori, Y. Yasu, S. Komatsu, and H. Mizuno, “In-situ measurement of supply-noise maps with millivolt accuracy and nanosecond-order time resolusion, ” Symp. VLSI Circuits Dig. Tech. Papers, pp.63-64, June 2006.

5. On-Die Droop Detector for Analog Sensing of Power Supply Noise