Affiliation:
1. National Institute of Advanced Industrial Science and Technology (AIST)
2. Hitachi, Ltd.
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Applied Mathematics,Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Signal Processing
Reference35 articles.
1. [1] T. Murakami, Y. Kaga, and K. Takahashi, “On restricting modalities in likelihood-ratio based biometric score fusion,” Proc. 23rd International Conference on Pattern Recognition (ICPR'16), pp.3031-3037, 2016. 10.1109/icpr.2016.7900100
2. [2] A. Ross, K. Nandakumar, and A.K. Jain, Handbook of Multibiometrics, Springer, 2006.
3. [3] ISO/IEC 19784, “Information technology-Biometric application programming interface-Part 1: BioAPI specification,” 2006.
4. [4] K. Nandakumar, Y. Chen, S.C. Dass, and A.K. Jain, “Likelihood ratio based biometric score fusion,” IEEE Trans. Pattern Anal. Mach. Intell., vol.30, no.2, pp.342-347, 2007. 10.1109/tpami.2007.70796
5. [5] K. Nandakumar, A.K. Jain, and A. Ross, “Fusion in multibiometric identification systems: What about the missing data?,” Proc. 3rd IAPR/IEEE International Conference on Biometrics (ICB'09), pp.743-752, 2009. 10.1007/978-3-642-01793-3_76