Diagnosis of Stochastic Discrete Event Systems Based on <i>N</i>-Gram Models with Wildcard Characters-Reference-Cited by-同舟云学术

Diagnosis of Stochastic Discrete Event Systems Based on N-Gram Models with Wildcard Characters

Published:2016 Issue:2 Volume:E99.A Page:462-467
ISSN:0916-8508
Container-title:IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
language:en
Short-container-title:IEICE Trans. Fundamentals

Author:

HIRAISHI Kunihiko¹,KOBAYASHI Koichi¹

Affiliation:

1. School of Information Science, Japan Advanced Institute of Science and Technology

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Applied Mathematics,Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Signal Processing

Link

https://www.jstage.jst.go.jp/article/transfun/E99.A/2/E99.A_462/_pdf

Reference21 articles.

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2. [2] M. Yoshimoto, K. Kobayashi, and K. Hiraishi, “Diagnosis of stochastic discrete event systems based on N-gram models,” IEICE Trans. Fundamentals, vol.E98-A, no.2, pp.618-625, 2015.

3. [3] M. Sampath, R. Sengupta, S. Lafortune, K. Sinnamohideen, and D. Teneketzis, “Diagnosability of discrete-event systems,” IEEE Trans. Autom. Control, vol.40, no.9, pp.1555-1575, 1995.

4. [4] X. Wang, I. Chattopadhyay, and A. Ray, “Probabilistic fault diagnosis in discrete event systems,” 2004 43rd IEEE Conference on Decision and Control (CDC), vol.5, pp.4794-4799, 2004.

5. [5] D. Thorsley and D. Teneketzis, “Diagnosability of stochastic discrete-event systems,” IEEE Trans. Autom. Control, vol.50, no.4, pp.476-492, 2005.