Start-up and frequency stability analysis using time varying root locus-Reference-Cited by-同舟云学术

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Start-up and frequency stability analysis using time varying root locus

Published:2015 Issue:22 Volume:12 Page:20150661-20150661
ISSN:1349-2543
Container-title:IEICE Electronics Express
language:en
Short-container-title:IEICE Electron. Express

Author:

Jain Sanjeev¹,Tchamov Nikolay T.¹

Affiliation:

1. Department of Electronics and Communication Engineering, Tampere University of Technology

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://www.jstage.jst.go.jp/article/elex/12/22/12_12.20150661/_pdf

Reference13 articles.

1. [1] N. M. Nguyen and R. G. Meyer: IEEE J. Solid-State Circuits 27 (1992) 810. DOI:10.1109/4.133172

2. [2] Q. Wang, R. L. Geiger and D. J. Chen: IEEE Intl. Midwest Symposium on Circuits and Systems (2014) 406. DOI:10.1109/MWSCAS.2014.6908438

3. [3] S. S. Broussev and N. T. Tchamov: IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 29 (2010) 830. DOI:10.1109/TCAD.2010.2043592

4. [4] S. S. Broussev: Ph.D thesis Tampere University of Technology, Finland (2012).

5. [5] J. Jarvenhaara, N. T. Tchamov and I. M. Filanovsky: IEEE International Symposium on Circuits and Systems (2015). DOI:10.1109/ISCAS.2015.7169228

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