Noncoherency correction algorithm for removing spectral leakage in ADC spectral test
Author:
Affiliation:
1. Shool of Electronics and Information Engineering, Xi’an Jiaotong University
2. Department of Electrical and Computer Engineering, Iowa State University
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
https://www.jstage.jst.go.jp/article/elex/13/2/13_12.20150991/_pdf
Reference19 articles.
1. [1] International Technology Roadmap for Semiconductors (2013) http://public.itrs.net.
2. [2] IEEE Standard for Terminology and Test Methods for Analog to Digital Converters, IEEE Std. 1241 (2011). DOI:10.1109/IEEESTD.2011.5692956
3. [3] M. Wu, G. Chen and D. Chen: IEICE Electron. Express 9 (2012) 1485. DOI:10.1587/elex.9.1485
4. [4] A. V. Oppenheim and R. W. Schafer: Discrete-Time Signal Processing (Prentice-Hall, Upper Saddle River, 2010) 3rd ed. 541.
5. [5] G. D’Antona and A. Ferrero: Digital Signal Processing for Measurement Systems Theory and Applications (Springer-Verlag, New York, 2005) 57.
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